1. Simultaneous/Multifunctional Analysis:
  • Raman measurements
  • Luminiscent measurements
  • Laser Reflection and Transmission Measurements
  • 3D high-contrast images in reflected light
  • 3D Raman confocal measurements
  • Information about spectral and polarization propertis of a sample
2. Spatial resolution:
  • horizontal up to 200 nm
  • axial up to 500 nm
3. Wide spectral range:
  • 785nm: spectral range 50 - 3700cm-1
  • 633nm: spectral range 60 - 6700cm-1
  • 488nm: spectral range 150 - 10000cm-1
4. Simultaneous use of up to 5 lasers by switching over the components inside the system.
5. The scanning system provides, alongside with point-to-point scanning, fast scanning (1000x1000 pixel per 3 seconds) of a specimen with PMT signal registration. The scanning area: 130x130 µm
6. Specially designed monochromator-spectrograph with unique parameters:
  • spectral resolution up to 0.006 nm
  • astigmatism less than 5 µm
7. Use of inverted and upright microscopes is possible.
8. Telescope with variable magnification for adapting laser beams to entrance pupils of microobjectives from 3 to 12 mm.
9. Polarized measurements.
10. High sensitivity at low power of laser excitation (from µW to mW).
11. Reflection module for simultaneous obtaining of 3D image in reflected light.
12. Transmission measurements option.
13. Fully automated control of the system.
14. High temporal and temperature stability is provided by modular rigid and rod design.
15. No fiber optics that decrease some optical parameters (transmission, wave front, polarization).
16. Ring illumination for combination with AFM.

Signal decrease from 90 % to 10 % at 200 nm,  λ=514 nm, 100Х immersion lens

Resolution along Z-axis. The reflection from silicon wafer, obtained by moving the objective lens along the Z axis. FW HW - 442 nm, λ=488 nm, 100x objective lens.

Specially designed monochromator-spectrograph with unique parameters: spectral resolution up to 0.006 nm, astigmatism less than 5 µm. Absolute wavelength accurasy: about 0.016 nm (for grating 2400 l/mm). Pinhole spectral image at CCD camera. Pixel size: 12 µm. Pinhole size: 12 µm. Image size: 1.5 pixel

Raman spectrum of Si wafer. Si (4) peak is clearly detected. Si (1) and Si (2) are in deep saturation. Confocal mode. Accumulation time - 60 seconds. 488 nm laser, 5 mW power

 
  • Biosciense Study of living cells cancerous pre-cancerous tissues, DNA, cytological investigations
  • Material science Investigation of physical structure and chemical composition of semiconductors, thin films and other materials and structures
  • Nanotechnology Study of physical properties of new carbonic nanomaterials such as graphene and nanotubes, determination of stress and deformation, estimation of structural order
  • Geoscience Identification of minerals, detection of sample components distribution and their phases; jewels characterization and inclusions determination
  • Heritage and Art Non-destructive identification of different findings in the result of archeological excavations, identification of pigments, undercoatings on pictures, icons, wall paintings, ceramics
  • Organic chemistry Study of chemical reaction mechanisms
  • Polymer chemistry Coating technological process monitoring, investigation of polymer materials , including thin films
  • Pharmaceutical Determination of distribution of pharmaceutical ingredients in drugs, raw material identification , monitoring and controlling of manufacturing processes
  • Cosmetology Ointment, cream investigations as well as their penetration capability
  • Forensic science Identification of unknown substances, different types of fibers, glass, paints , explosive materials, narcotic and toxic substances
  For more information visit: www.solinstruments.com